<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Xavier, D.</style></author><author><style face="normal" font="default" size="100%">Aitken, R.C.</style></author><author><style face="normal" font="default" size="100%">Ivanov, A.</style></author><author><style face="normal" font="default" size="100%">Agarwal, V.K.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Using an asymmetric error model to study aliasing in signature analysis registers</style></title><secondary-title><style face="normal" font="default" size="100%">Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">aliasing behavior</style></keyword><keyword><style  face="normal" font="default" size="100%">asymmetric error model</style></keyword><keyword><style  face="normal" font="default" size="100%">error statistics</style></keyword><keyword><style  face="normal" font="default" size="100%">fault-free sequence</style></keyword><keyword><style  face="normal" font="default" size="100%">independent error model</style></keyword><keyword><style  face="normal" font="default" size="100%">linear feedback shift registers</style></keyword><keyword><style  face="normal" font="default" size="100%">logic testing</style></keyword><keyword><style  face="normal" font="default" size="100%">probability</style></keyword><keyword><style  face="normal" font="default" size="100%">pseudorandom testing</style></keyword><keyword><style  face="normal" font="default" size="100%">shift registers</style></keyword><keyword><style  face="normal" font="default" size="100%">signature analysis registers</style></keyword><keyword><style  face="normal" font="default" size="100%">test set ordering</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">1992</style></year><pub-dates><date><style  face="normal" font="default" size="100%">jan.</style></date></pub-dates></dates><urls><web-urls><url><style face="normal" font="default" size="100%">http://dx.doi.org/10.1109/43.108615</style></url></web-urls></urls><number><style face="normal" font="default" size="100%">1</style></number><volume><style face="normal" font="default" size="100%">11</style></volume><pages><style face="normal" font="default" size="100%">16 -25</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">Recent predictions about the aliasing behavior of linear feedback shift registers used in signature analysis with pseudorandom testing are validated experimentally. It is shown that the independent error model accurately predicts aliasing in these signature registers when test sets are selected at random. In practice, however, a circuit's test set is fixed, and it is shown that adopting a more general asymmetric error model, of which the independent is a special case, yields more accurate aliasing information, especially in the dynamic or non-steady-state region of the aliasing profile. The only additional information needed to apply the asymmetric model to signature analysis is the fault-free sequence. Since this sequence is needed in any case to compute the fault-free signature, the model can reflect test set ordering at no extra cost</style></abstract></record></records></xml>