<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Dalmia, M.</style></author><author><style face="normal" font="default" size="100%">Ivanov, A.</style></author><author><style face="normal" font="default" size="100%">Tabatabaei, S.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Power supply current monitoring techniques for testing PLLs</style></title><secondary-title><style face="normal" font="default" size="100%">Test Symposium, 1997. (ATS '97) Proceedings., 6th Asian</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">analogue circuit testing</style></keyword><keyword><style  face="normal" font="default" size="100%">analogue integrated circuits</style></keyword><keyword><style  face="normal" font="default" size="100%">automatic testing</style></keyword><keyword><style  face="normal" font="default" size="100%">Circuit analysis computing</style></keyword><keyword><style  face="normal" font="default" size="100%">current testing</style></keyword><keyword><style  face="normal" font="default" size="100%">digital IC</style></keyword><keyword><style  face="normal" font="default" size="100%">electric current measurement</style></keyword><keyword><style  face="normal" font="default" size="100%">fault detection</style></keyword><keyword><style  face="normal" font="default" size="100%">fault diagnosis</style></keyword><keyword><style  face="normal" font="default" size="100%">integrated circuit testing</style></keyword><keyword><style  face="normal" font="default" size="100%">mixed analogue-digital integrated circuits</style></keyword><keyword><style  face="normal" font="default" size="100%">mixed-signal ICs</style></keyword><keyword><style  face="normal" font="default" size="100%">Monte Carlo methods</style></keyword><keyword><style  face="normal" font="default" size="100%">nonlinear circuits</style></keyword><keyword><style  face="normal" font="default" size="100%">phase locked loops</style></keyword><keyword><style  face="normal" font="default" size="100%">phase-locked loops</style></keyword><keyword><style  face="normal" font="default" size="100%">PLL testing</style></keyword><keyword><style  face="normal" font="default" size="100%">power supply current monitoring</style></keyword><keyword><style  face="normal" font="default" size="100%">VCO testing</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">1997</style></year><pub-dates><date><style  face="normal" font="default" size="100%">nov.</style></date></pub-dates></dates><urls><web-urls><url><style face="normal" font="default" size="100%">http://dx.doi.org/10.1109/ATS.1997.643984</style></url></web-urls></urls><pages><style face="normal" font="default" size="100%">366 -371</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">The effectiveness of current testing for digital IC's has led researchers to explore the possibility of extending this concept to testing analog blocks of mixed-signal ICs. Unfortunately, test techniques developed for commonly-studied analog blocks such as op-amps and filters do not apply to non-linear blocks such as phase-locked loops. This paper focuses on investigating the effectiveness of using an operating power supply current monitoring technique to detect potential faults in a phase-locked loop (PLL) circuit</style></abstract></record></records></xml>