Catastrophic short and open fault detection in bipolar CML circuits: A case study

TitleCatastrophic short and open fault detection in bipolar CML circuits: A case study
Publication TypeJournal Article
Year of Publication2000
AuthorsIvanov, A., and V. Devdas
JournalJournal of Electronic Testing-Theory and Applications
Volume16
Pagination631–634
ISSN0923-8174
Abstract

The detection of catastrophic short and open faults in bipolar current mode logic (CML) circuits is studied. The non-intrusive tests considered include functional (logic) tests, an Idd test, and a common-mode test. A 622 Mbps SONET SIPO (Serial-In/Parallel-Out) and a PISO (Parallel-In/Serial-Out) circuit form the basis of this case study.

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