Jitter models and measurement methods for high-speed serial interconnects

TitleJitter models and measurement methods for high-speed serial interconnects
Publication TypeConference Paper
Year of Publication2004
AuthorsKuo, A., T. Farahmand, N. Ou, S. Tabatabaei, and A. Ivanov
Conference NameTest Conference, 2004. Proceedings. ITC 2004. International
Pagination1295 - 1302
Date Publishedoct.
KeywordsBER, bit error rate, bounded uncorrelated jitter, crosstalk, data communication, error statistics, high speed serial interconnects, jitter, jitter measurement methods, jitter models, jitter PDF, jitter subcomponents, probability, serial communication link, telecommunication links
Abstract

Jitter can be decomposed into several subcomponents, each having specific sets of characteristics and root-causes. This work focuses on describing causes and measurement methods of jitter subcomponents. We first describe the relationship between a jitter PDF and bit error rate (BER) followed by a discussion on what causes jitter. Common jitter measurement methods are presented, along with an analysis of their respective advantages and disadvantages. Our recent research on the cause and practical measurement results and design issues of bounded uncorrelated jitter (BUJ), a subcomponent of jitter, due to crosstalk, is also presented.

URLhttp://dx.doi.org/10.1109/TEST.2004.1387404
DOI10.1109/TEST.2004.1387404

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